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Filtering by: Subject Transistor amplifiers Remove constraint Subject: Transistor amplifiers Creator Ge, David Ying Remove constraint Creator: Ge, David Ying

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  • Reliability and hot-electron effects in analog and mixed-mode circuits

    Creator:
    Ge, David Ying
    Abstract:
    Reliability of sub-micron analog circuits is directly related to impact ionization and the subsequent changes in threshold voltage and drain current of n-MOSFET devices. This thesis presents theory of the hot-electron effects on the device characteristics and circuit performance, explores several approaches to improve performance at both the device and...
    Resource Type:
    Masters Thesis
    Full Text:
    degradation. By using the composite device in the output gain stage of a CMOS differential amplifier with