Skip to Content
Toggle navigation
Switch language
English
Switch language
Deutsch
English
Español
Français
Italiano
Português do Brasil
中文
Login
ScholarsArchive@OSU
Home
About
Help
Contact
Search ScholarsArchive@OSU
Go
Advanced Search
Search Constraints
Start Over
Filtering by:
Creator
Hoshino, Ken
Remove constraint Creator: Hoshino, Ken
1
-
2
of
2
Sort by Date Uploaded ▼
Relevance
Title [A-Z]
Title [Z-A]
Date Created ▼
Date Created ▲
Date Uploaded ▼
Date Uploaded ▲
Number of results to display per page
10 per page
10
per page
20
per page
50
per page
100
per page
View results as:
List
Gallery
Masonry
Search Results
Fabrication process assessment and negative bias illumination stress study of IGZO and...
Instability and temperature-dependence assessment of IGZO TFTs
Toggle facets
Limit your search
Academic Affiliation
Electrical Engineering and Computer Science
2
Advisor
Wager, John F.
2
Commencement Year
Commencement Year range begin
–
Commencement Year range end
Current results range from
2009
to
2012
View distribution
Committee Member
Keszler, Douglas A.
2
Conley, John F. Jr.
1
Conley, John F., Jr
1
Hackleman, David
1
Jander, Albrecht
1
more
Committee Members
»
Creator
Hoshino, Ken
2
Date
Date range begin
–
Date range end
Current results range from
2008
to
2012
View distribution
Decade
2010-2019
1
2000-2009
1
Degree Field
Electrical and Computer Engineering
2
Degree Level
Doctoral
1
Master's
1
Degree Name
Doctor of Philosophy (Ph.D.)
1
Master of Science (M.S.)
1
Language
English [eng]
2
License
All rights reserved
2
Non-Academic Affiliation
Oregon State University. Graduate School
2
Peer Reviewed
No
2
Resource Type
Dissertation
1
Masters Thesis
1
Rights Statement
In Copyright
2
Subject
Gallium compounds
2
Indium compounds
2
Thin film transistors
2
Amorphous semiconductors
1
Metallic oxides
1
more
Subjects
»