A study of deep levels of the emitter region of a
heterojunction bipolar transistor is investigated using deep
level transient spectroscopy (DLTS), deep level admittance
spectroscopy (DLAS), thermally stimulated capacitance
(TSCAP), and capacitance-voltage (C-V) profiling. The DX
center, with an activation energy of 0.45 eV, is the only
deep level...