This thesis presents a design-oriented model for lightly doped CMOS substrates. The model predicts the substrate noise coupling between noisy digital and sensitive analog blocks in the early stages of the design. The model scales with the size and separation of these blocks and it is validated with device simulations...
A computationally efficient and accurate substrate noise coupling model for multiple contacts in heavily doped CMOS processes is presented and validated with simulations and experimental data. The model is based on Z parameters that are scalable with contact separation and size. This results in fast extraction of substrate resistances for...
This thesis presents Silencer!, a fully automated, schematic-driven tool for substrate noise coupling simulation and analysis. It has been integrated in the CADENCE DFII environment and seamlessly enables substrate coupling analysis in a standard mixed-signal design flow. Silencer! aids IC designers in the analysis of substrate noise coupling at different...
This thesis presents the contributions to substrate noise due to supply coupling and the effect of pin parasitics on the substrate noise generated by digital circuits. Various sources of substrate noise and their effect on analog circuits sharing the same substrate are discussed. A simulation approach to isolate the various...
An analysis of substrate noise coupling in mixed-signal circuits has been performed in the TSMC 0.25 [mu]m lightly doped and heavily doped CMOS processes. Methods to minimize noise coupling in both the chip design and board design phases are presented along with techniques for accurate circuit simulation of noise coupling....
Analysis of substrate noise coupling has been performed for a 0.18¹m lightly doped silicon germanium BiCMOS process. Techniques to minimize noise coupling in the chip and board design are presented, as well as methods for accurate modeling for substrate noise coupling simulations. Measurements from a test chip were taken to...
A methodology for rapid estimation of substrate noise generated by digital circuitry in mixed-signal circuits is presented. This methodology is incorporated into the Silencer! framework, and also provides for future improvements including pre-layout noise estimation. Measurements of a test chip fabricated in the TSMC o.25[mu]m heavily doped logic process validate...
The substrate noise injected by a stepped buffer circuit into two single-ended 1.5GHz low noise amplifiers is examined for a heavily doped 0.25µm CMOS process. The difference in the LNA noise rejection is characterized as a function of the size and placement of substrate contacts. The use of a resistive...
Delay insensitive asynchronous circuitry provides significant advantages with
respect to substrate noise due to localized switching. The differences between the
substrate noise from NULL Convention Logic (NCL) and traditional Clocked
Boolean Logic (CBL) are described and analyzed based on measured results. A test chip fabricated in the TSMC 0.25 um...
Efficient methods for simulating the substrate noise generated by complex synchronous and asynchronous digital logic circuits are presented. By simulating digital logic at the gate level, and precharacterizing the gates, the substrate noise generation can be predicted and used in a transistor level simulation of the sensitive analog blocks. This...
At frequencies exceeding 1-2 GHz, the reactive nature of a silicon substrate must be accounted in the substrate network models used in substrate coupling simulation. High-frequency substrate models, containing reactive components, must be validated through high-frequency network analyzer measurements. Prior fabricated test fixtures have been modified to enable high-frequency (up...
This research work focuses on the mechanism of 1/f noise in GaAs
resistors on semi-insulating substrates and 1/f noise due to temperature
fluctuations in heat conduction in resistors, diodes, and bipolar transistors. The
goal of this research is to generate accurate models to explain physical origin of 1/f
noise in...
In this thesis, the performance degradation of a phase-locked loop due to substrate noise is examined. A new analytical equivalent circuit model for substrate noise coupling is derived for a heavily doped silicon substrate. The model has been validated with measured data from a 0.35 μm CMOS process. Since the...