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Filtering by: Subject Testing-machines -- Valuation Remove constraint Subject: Testing-machines -- Valuation Date 1993 Remove constraint Date: 1993

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  • Application of a bayesian network to integrated circuit tester diagnosis

    Creator:
    Mittelstadt, Daniel Richard
    Abstract:
    This thesis describes research to implement a Bayesian belief network based expert system to solve a real-world diagnostic problem troubleshooting integrated circuit (IC) testing machines. Several models of the IC tester diagnostic problem were developed in belief networks, and one of these models was implemented using Symbolic Probabilistic Inference (SPI)....
    Resource Type:
    Masters Thesis
    Full Text:
    these machines operational 24 hours a day to maximize return on their investment. Testing machine