Search Constraints

Start Over
Filtering by: Date issued sim 2008-10-31 Remove constraint Date issued sim: 2008-10-31 Degree Field Electrical and Computer Engineering Remove constraint Degree Field: Electrical and Computer Engineering Peer Reviewed No Remove constraint Peer Reviewed: No

Search Results

  • Instability and temperature-dependence assessment of IGZO TFTs

    Creator:
    Hoshino, Ken
    Abstract:
    Amorphous oxide semiconductors (AOSs) are of great current interest for thin-film transistor (TFT) channel layer applications. In particular, indium gallium zinc oxide (IGZO) is under intense development for commercial applications because of its demonstrated high performance at low processing temperatures. The objective of the research presented in this thesis is...
    Resource Type:
    Masters Thesis