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Filtering by: Subject Testing-machines -- Valuation Remove constraint Subject: Testing-machines -- Valuation Degree Name Master of Science (M.S.) Remove constraint Degree Name: Master of Science (M.S.)

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  • Application of a bayesian network to integrated circuit tester diagnosis

    Creator:
    Mittelstadt, Daniel Richard
    Abstract:
    This thesis describes research to implement a Bayesian belief network based expert system to solve a real-world diagnostic problem troubleshooting integrated circuit (IC) testing machines. Several models of the IC tester diagnostic problem were developed in belief networks, and one of these models was implemented using Symbolic Probabilistic Inference (SPI)....
    Resource Type:
    Masters Thesis
    Full Text:
    these machines operational 24 hours a day to maximize return on their investment. Testing machine