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Filtering by: Creator Aminzadeh, Payman G. Remove constraint Creator: Aminzadeh, Payman G. Language English [eng] Remove constraint Language: English [eng]

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  • Hot carrier degradation of sub-micron n-channel MOSFETs subject to static stress

    Creator:
    Aminzadeh, Payman G.
    Abstract:
    Hot carrier effects in sub-micron lightly doped drain (LDD) n-channel MOSFETs under static (DC) stress are studied in order to establish the degradation mechanisms of such devices. Degradation is monitored as a function of time at various gate voltages. Under accelerated aging conditions (i.e. large drain voltages) the gate voltage...
    Resource Type:
    Masters Thesis
    Full Text:
    Subject to Static Stress AN ABSTRACT OF THE THESIS OF Payman G. Aminzadeh for the degree of Master of

  • Recombination and generation lifetime characterization of p/p⁺ epitaxial silicon wafers

    Creator:
    Aminzadeh, Mehran G.
    Abstract:
    The refresh times of all dynamic charge storage devices, best characterized by the generation lifetime at roan temperature and the recombination lifetime at higher device operating temperatures (T>70°C), strongly influence the efficient and successful operation of dynamic charge storage devices such as DRAM's and CCD's. Both recombination and generation lifetime...
    Resource Type:
    Dissertation
    Full Text:
    of p/p⁺ epitaxial silicon wafers AN ABSTRACT OF THE THESIS OF Mehran G. Aminzadeh for the degree