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  • Electrical recommendations and formulas for metal fill in radio-frequency integrated circuits

    Creator:
    Gaskill, Steven
    Abstract:
    With increasing transistor operating frequencies, interconnects and passive devices are becoming performance limiters in integrated circuit (IC) designs. To combat this, the interconnect layers above the active silicon are trending toward low-κ dielectrics and Cu metallization. The use of these new materials has popularized chemical mechanical polishing (CMP) to planarize...
    Resource Type:
    Masters Thesis
    Full Text:
    Recommendations and Formulas for Metal Fill in Radio-Frequency Integrated Circuits Abstract approved: Andreas

  • Enabling metal-fill-aware design of integrated circuits

    Creator:
    Shilimkar, Vikas S.
    Abstract:
    In advanced integrated circuit (IC) processes, the metal fill inserted to meet foundry imposed density requirements degrades the performance of interconnects and passive components which ultimately affects the overall circuit performance. Accounting for this degradation through electromagnetic and equivalent circuit modeling is becoming a critical aspect of IC design. However,...
    Resource Type:
    Dissertation
    Full Text:
    presented on January 3, 2014. Title: Enabling Metal-Fill-Aware Design of Integrated Circuits Abstract