Index Catalog // ScholarsArchive@OSU

Creator:: Du, Xiaosong, Flynn, Brendan T., Motley, Joshua R., Stickle, William F., Bluhm, Hendrik, and Herman, Gregory S.
Abstract:: Self-assembled monolayers (SAMs) have been used to improve both the positive and negative bias-stress stability of amorphous indium gallium zinc oxide (IGZO) bottom gate thin film transistors (TFTs). N-hexylphosphonic acid (HPA) and fluorinated hexylphosphonic acid (FPA) SAMs adsorbed on IGZO back channel surfaces were shown to significantly reduce bias-stress turn-on...
Resource Type:: Article
Full Text:: Improved Electrical Stability of Amorphous In-Ga-Zn-O Thin-Film Transistors Du, X., Flynn, B. T., Motley

Creator:: Kaplan, Jonathan Michael
Abstract:: Some authors defending the "hereditarian" hypothesis with respect to differences in average IQ scores between populations have argued that the sorts of environmental variation hypothesized by some researchers rejecting the hereditarian position should leave discoverable statistical traces, namely changes in the overall variance of scores or in variance-covariance relating scores...
Resource Type:: Article
Full Text:: Flynn (2006a) argue that the “gap” has been narrowing over time, and that estimates of the current gap

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