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Filtering by: Advisor Milne, David H. Remove constraint Advisor: Milne, David H. Resource Type Undergraduate Thesis Remove constraint Resource Type: Undergraduate Thesis

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  • Exploiting Diffraction Orders from a Phase Limited SLM to Remove and Model Zernike Aberrations

    Creator:
    Goschie, Aaron J.
    Abstract:
    Using a plastic bottle, we explore the capabilities of a reflective phase-only Spatial Light Modulator (SLM) in removing wavefront aberrations using a Zernike polynomial phase mask, with the modulators phase depth limited to 0.8π radians. Wavefront aberrations, which can be modeled with Zernike polynomials, distort image transmission through various optical...
    Resource Type:
    Undergraduate Thesis
    Full Text:
    David H. McIntyre submitted to the Department of Physics, Oregon State University in partial

  • Fourier Analysis of Smartphone Call Quality

    Creator:
    Dempsey, Zackery E.
    Abstract:
    In recent decades, the cell phone has provided a convenient form of long-distance communi-cation to the general public. Despite the technological improvements since, cell phones and their smartphone successors have suffered from a lack of clarity over a typical voice call, a result of their limited bandwidth. New phone services,...
    Resource Type:
    Undergraduate Thesis
    Full Text:
    Fourier Analysis of Smartphone Call Quality Zackery Dempsey Advisor: David McIntyre Oregon State

  • Bandgap measurements of nonspecular materials using a bifurcated fiber optic method of diffuse reflectance

    Creator:
    Wells, Blake
    Abstract:
    A method for determining bandgap energy using diffuse reflection is presented. The method uses bifurcated fiber optic cables to measure the diffuse reflection of diffusely reflective materials. The absorption spectrum is extrapolated from the diffuse reflection spectrum and used to determine the bandgap of powdered materials. The theory of nonspecular...
    Resource Type:
    Undergraduate Thesis
    Full Text:
    Blake Wells Oregon State University Department of Physics Advisor: Dr. David McIntyre 2015

  • Determining thickness of zinc sulfide thin films through optical spectroscopy

    Creator:
    Prudell, Kathleen
    Abstract:
    A method has been developed to measure the thickness of ZnS thin films on Si using optical interference. Thin film optical interference fringes are dependent upon the thickness of the film, and for this reason the thickness can be determined by measuring reflectance spectrum of a thin film. A grating...
    Resource Type:
    Undergraduate Thesis
    Full Text:
    of Physics Oregon State University June 1, 2014 Advisors: Dr. Janet Tate and Dr. David