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Filtering by: Subject Embedded computer systems -- Testing Subject Automatic test equipment

The Architecture of a Reusable Built-In Self-Test for Link Training, IO and Memory Defect Detection and Auto Repair on 14nm Intel SOC

Creator:

Querbach, Bruce

Abstract:

The complexity of designing and testing today's system on chip (SOC) is increasing due to greater integrated circuit (IC) density and higher IO and memory frequencies. SOCs for the mobile phone and tablet market have the unique challenge of short product development windows, at times less than six months, and...

Resource Type:

Dissertation

Full Text:

: ______________________________________________________ Patrick Y. Chiang The complexity of designing and testing today’s system on chip