The refresh times of all dynamic charge storage devices, best
characterized by the generation lifetime at roan temperature and the
recombination lifetime at higher device operating temperatures
(T>70°C), strongly influence the efficient and successful operation
of dynamic charge storage devices such as DRAM's and CCD's. Both
recombination and generation lifetime...
A primarily software based Fourier Deep Level Transient Spectroscope (FDLTS) is built. The raw capacitance transient is acquired and digitized using capacitance meter HP4280A whereas the signal analysis is done using a customized software module. The software module calculates both the conventional DLTS spectrum and the Fourier DLTS spectrum. This...