Graduate Thesis Or Dissertation
 

Test fixture characterization for high-frequency silicon substrate parasitic extraction

Público Deposited

Contenido Descargable

Descargar PDF
https://ir.library.oregonstate.edu/concern/graduate_thesis_or_dissertations/3t945t843

Descriptions

Attribute NameValues
Creator
Abstract
  • At frequencies exceeding 1-2 GHz, the reactive nature of a silicon substrate must be accounted in the substrate network models used in substrate coupling simulation. High-frequency substrate models, containing reactive components, must be validated through high-frequency network analyzer measurements. Prior fabricated test fixtures have been modified to enable high-frequency (up to 20 GHz) network parameter measurements of a 0.35 um CMOS heavily-doped silicon substrate through an on-chip probing scheme. The performance of the test fixture and the measurement deembedding procedure has been evaluated, and suggestions for future improvements are presented. A new probing scheme is proposed to enable high-frequency network parameter measurements of a silicon substrate. The design of the test structures and the deembedding procedure has been validated through extensive simulations in HFSS.
License
Resource Type
Fecha Disponible
Fecha de Emisión
Degree Level
Degree Name
Degree Field
Degree Grantor
Commencement Year
Advisor
Committee Member
Academic Affiliation
Non-Academic Affiliation
Subject
Declaración de derechos
Publisher
Language
File Format
File Extent
  • 3880706 bytes
Replaces

Relaciones

Parents:

This work has no parents.

En Collection:

Elementos

Miniatura Título Fecha de subida Visibilidad Acciones
file details mythesis_10052007.pdf 2017-08-14 Público Descargar