Skip to Content
Toggle navigation
Switch language
English
Switch language
Deutsch
English
Español
Français
Italiano
Português do Brasil
中文
Login
ScholarsArchive@OSU
Home
About
Help
Contact
Search ScholarsArchive@OSU
Go
Advanced Search
MLA
Pham, Hui En.
Substrate Noise Coupling Analysis In 0.18um Silicon Germanium (sige) and Silicon On Insulator (soi) Processes.
: Oregon State University, 2004.