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Filtering by: Committee Member David, Hackleman Academic Affiliation Electrical Engineering and Computer Science Contributor advisor sim Fiez, Terri Decade 2000-2009

1. A test fixture and deembedding procedure for high-frequency substrate characterization

Creator:: Webb, Kyle M.
Abstract:: At frequencies exceeding 1-2 GHz, the substrate network models used in substrate coupling simulation must account for the reactive nature of the substrate. Unlike at low frequencies, where the purely resistive substrate models can be validated through DC resistance measurements, these high-frequency models, comprising reactive components, must be validated through...
Resource Type:: Masters Thesis
Full Text:: providing guidance along the way. Thanks also to Dr. Andreas Weisshaar and Dr. David Hackleman for serving

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1. A test fixture and deembedding procedure for high-frequency substrate characterization

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1. A test fixture and deembedding procedure for high-frequency substrate characterization

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