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Filtering by: Advisor Fiez, Terri Committee Member Hackleman, David File Format application/pdf Rights Statement Copyright Not Evaluated

1. A test fixture and deembedding procedure for high-frequency substrate characterization

Creator:: Webb, Kyle M.
Abstract:: At frequencies exceeding 1-2 GHz, the substrate network models used in substrate coupling simulation must account for the reactive nature of the substrate. Unlike at low frequencies, where the purely resistive substrate models can be validated through DC resistance measurements, these high-frequency models, comprising reactive components, must be validated through...
Resource Type:: Masters Thesis