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Tate, Janet
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Date
2014
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Thermoelectric Characterization of SiliconWafers and Cu₁₂Sb₄S₁₃ Variant Thin Films
Thermal conductivity measurements of amorphous metal thin films via the 3ω method
Measurement and Modeling of Zinc Sulfide Thin Films using Ellipsometry and Reflection ...
Determining thickness of zinc sulfide thin films through optical spectroscopy
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Academic Affiliation
Physics
2
Advisor
Tate, Janet
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4
Mcintyre, David H.
1
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Committee Member
Gibbons, Brady J.
1
Jansen, Henri J. F.
1
Ostroverkhova, Oksana
1
Creator
Kratzer, Aaron
1
Kratzer, Aaron C.
1
Prudell, Kathleen
1
Snyder, Rodney Austin
1
Zhan, Kai
1
Date
2014
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4
Decade
2010-2019
4
Degree Field
Physics
4
Mathematics
1
Degree Level
Bachelor's
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Bachelor of Science (B.S.)
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Honors Bachelor of Science (H.B.S.)
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Master of Science (M.S.)
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Language
English [eng]
4
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All rights reserved
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Non-Academic Affiliation
Oregon State University. Graduate School
1
Oregon State University. Honors College
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Peer Reviewed
No
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Undergraduate Thesis
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Honors College Thesis
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Masters Thesis
1
Rights Statement
In Copyright
4
Subject
Metallic films -- Thermal conductivity
1
Metallic glasses -- Thermal conductivity
1