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Filtering by: Committee Member Goodnick, S. M.

Internal charge-phosphor field analysis, electrical characterization, and aging studies of AC thin-film electroluminescent devices

Creator:

Abu-Dayah, Ahmad I.

Resource Type:

Masters Thesis
Hot carrier degradation of sub-micron n-channel MOSFETs subject to static stress

Creator:

Aminzadeh, Payman G.

Abstract:

Hot carrier effects in sub-micron lightly doped drain (LDD) n-channel MOSFETs under static (DC) stress are studied in order to establish the degradation mechanisms of such devices. Degradation is monitored as a function of time at various gate voltages. Under accelerated aging conditions (i.e. large drain voltages) the gate voltage...

Resource Type:

Masters Thesis
Electo-optic characterization of ZnS:Tb ACTFEL devices for probing the hot electron distribution

Creator:

Streicher, Keone R.

Abstract:

In this report, the optical characteristics of ZnS:Tb AC driven thin-film electroluminescent devices are evaluated. Luminescence at low and room temperature under a constant phosphor field is recorded in order to probe the hot electron energy distribution. Samples fabricated by atomic layer epitaxy and by sputter deposition are investigated and...

Resource Type:

Masters Thesis