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Filtering by: Creator Kennelly, Patrick J., (Patrick Joseph) Remove constraint Creator: Kennelly, Patrick J., (Patrick Joseph) Degree Level Doctoral Remove constraint Degree Level: Doctoral Subject Low voltage integrated circuits -- Reliability Remove constraint Subject: Low voltage integrated circuits -- Reliability

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  • Methods to improve the reliability and resiliency of near/sub-threshold digital circuits

    Creator:
    Crop, Joseph A.
    Abstract:
    Energy consumption is one of the primary bottlenecks to both large and small scale modern compute platforms. Reducing the operating voltage of digital circuits to voltages where the supply voltage is near or below the threshold of the transistors has recently gained attention as a method to reduce the energy...
    Resource Type:
    Dissertation
    Full Text:
    Near/Sub-Threshold Digital Circuits AN ABSTRACT OF THE DISSERTATION OF Joseph A. Crop for the

  • Measurement and analysis of soft error vulnerability of low-voltage logic and memory circuits

    Creator:
    Pawlowski, Robert
    Abstract:
    Scaling the supply voltage into the sub/near-threshold domain is one of the most effective methods for improving the energy efficiency of next-generation electronic microsystems. Unfortunately, the relationship between low-voltage operation and radiation-induced soft error rate is not widely known, as little research has been previously performed and reported for soft-error...
    Resource Type:
    Dissertation
    Full Text:
    approved: Patrick Yin Chiang Scaling the supply voltage into the sub/near-threshold domain is one of