This thesis examines substrate noise coupling for NMOS transistors in heavily doped substrates. The study begins with the analysis of an NMOS transistor switching noise in a digital inverter at the device level. A resistive substrate network for the NMOS transistor is proposed and verified. Coupling between N+- P+ contacts...
An automated method, requiring the fabrication of a small set of test structures, efficiently extracts the coefficients of Z-parameter based macromodels. The extraction approach has been validated for both heavily and lightly doped substrates and can be applied to a variety of technologies. After the parameters of a macromodel have...
A Z-parameter based macromodel for characterizing the substrate noise coupling in a lightly doped substrate at low frequencies has been developed. The model is scalable with contact geometries and separation. The cross-coupling impedance between two contacts is modeled using an improved geometric mean distance formulation. This approach obviates the need...