Electroluminescence thermal quenching in SrS:Cu thin-film electroluminescent devices

Citeable URL: https://ir.library.oregonstate.edu/concern/articles/bn9997943

Descriptions

Attribute Name	Values
Creator	Baukol, B. A. Hitt, J. C. Keir, P. D. Wager, J. F.
Abstract	Electroluminesence (EL) thermal quenching refers a reduction in luminance, concomitant with a reduction in transferred charge, when an alternating-current thin-film electroluminescent (ACTFEL) device is operated at an elevated temperature. EL thermal quenching is found to be significant in SrS:Cu ACTFEL devices operated above ~60-80 °C. Maximum transferred charge-maximum applied voltage (Qmax-Vmax) and transferred charge capacitance (i.e., dQmax /dVmax vs Vmax) measurements as a function of temperature in conjunction with ACTFEL device simulation are employed in order to establish that EL thermal quenching arises from a thermally activated annihilation of positive space charge and a corresponding increase in the threshold voltage.
Resource Type	Article
DOI	https://doi.org/10.1063/1.125697
Date Available	2010-01-27T22:40:07+00:00
Date Issued	2000-01-10
Citation	Baukol, B. A., Hitt, J. C., Keir, P. D., & Wager, J. F. (2000). Electroluminescence thermal quenching in SrS:Cu thin-film electroluminescent devices [Electronic version]. Applied Physics Letters, 76(2), 185-187.
Journal Title	Applied Physics Letters
Journal Volume	76
Dichiarazione dei diritti	Copyright Not Evaluated
Publisher	American Institute of Physics
Language	English [eng]
Replaces	http://hdl.handle.net/1957/14135