Graduate Thesis Or Dissertation
 

Analysis and measurement of charge injection in switched-capacitor circuits

Öffentlich Deposited

Herunterladbarer Inhalt

PDF Herunterladen
https://ir.library.oregonstate.edu/concern/graduate_thesis_or_dissertations/ms35td013

Descriptions

Attribute NameValues
Creator
Abstract
  • It has been verified by theoretical analysis, circuit simulation and test that two switch transistors in parallel in a simple sample and hold circuit can be achieve high speed with low error voltage due to charge injection. The wide transistor provides low RC time constant when it is closed and the narrow one ensures a low error voltage. However, tradeoff can be made in a specific application. A concise analytical expression for switch-induced error voltage on a switched capacitor is derived in this thesis. It can help designer to make the optimum decision. Experimentally, it was found that the optimum size of the wide transistor is several times wider than the narrow one. Delayed clock scheme can be used to make charge injection signal-independent in a basic integrator structure. Using two transistors with different sizes and clock duty cycles in parallel can take advantage of the fast speed of the wide transistor and the small charge injection error of the small transistor. However, the combination of the two devices, including the size and clock duty cycles, should be chosen carefully to achieve the improvement.
Resource Type
Date Available
Date Issued
Degree Level
Degree Name
Degree Field
Degree Grantor
Commencement Year
Advisor
Committee Member
Academic Affiliation
Non-Academic Affiliation
Subject
Urheberrechts-Erklärung
Publisher
Peer Reviewed
Language
Digitization Specifications
  • File scanned at 300 ppi (Monochrome, 256 Grayscale) using Capture Perfect 3.0 on a Canon DR-9050C in PDF format. CVista PdfCompressor 4.0 was used for pdf compression and textual OCR.
Replaces

Beziehungen

Parents:

This work has no parents.

In Collection:

Artikel